BS EN IEC 60749-18:2019 PDF Download
Standard EN Sample
Semiconductor Devices - Mechanical and Climatic Test Methods - Ionizing Radiation (Total Dose)
Also Known As:
BS EN IEC 60749-18:2019 is a standard that specifies the test procedures for assessing the effects of ionizing radiation (total dose) on semiconductor devices such as integrated circuits and discrete devices. The test method involves exposing the devices to a cobalt-60 (60Co) gamma ray source or other suitable radiation sources. However, this standard only addresses steady-state irradiations and is not applicable to pulse type irradiations.
The standard is specifically intended for military and aerospace applications, where semiconductor devices may be exposed to ionizing radiation. It is worth noting that the test is destructive, meaning that the devices are likely to be damaged or destroyed during the testing process.
The 2019 edition of the standard includes several technical updates compared to the previous edition. These updates include aligning the test method with MIL-STD 883J, method 1019, which includes the use of enhanced low dose rate sensitivity (ELDRS) testing. Additionally, a Bibliography has been added to the standard, which includes relevant ASTM standards related to this test method.
| Descriptors | Integrated circuits, Annealing, Gamma-radiation, Semiconductor devices, Space technology, Climate, Environmental testing, Military engineering, Ionizing radiation, Cobalt, Mechanical testing, Electronic equipment and components |
| ICS Codes | 13.110 - Safety of machinery 25.040.99 - Other industrial automation systems 29.020 - Electrical engineering in general 31.080.01 - Semiconductor devices in general |
| Language(s) | English |
| ISBN | 978 0 539 00234 8 |
| File Size | 1.1 MB |
