CIE 226:2017 PDF Download

The CIE 226:2017 standard provides detailed guidelines and procedures for measuring LED packages and chips under specific conditions. LED devices have unique characteristics that require specialized measurement techniques to account for differences in heat dissipation and in order to obtain accurate readings.

To prevent excessive heating of the device during measurements, short current pulses are used instead of continuous current. These pulsed conditions must be converted into values that reflect the actual operating conditions of the LED, which can be done using information provided in the corresponding datasheet. The high-speed measurements required for efficient production testing necessitate specific measurement configurations that are based on the recommendations outlined in the CIE 127:2007 Technical Report, or at least traceable back to it.

The CIE 226:2017 standard describes the step-by-step procedures and configurations for performing high-speed measurements on LED packages and chips. It also addresses the unique properties of LEDs, such as the current and temperature dependencies of their electrical and optical properties. The publication is primarily written in English, with a brief summary available in French and German.