CIE CIE 225:2017

CIE 225:2017 PDF Download

Standard EN Sample
CIE 225:2017 Sample

Optical Measurement of High-Power LEDs

SKU171315444 Published by International Commission on Illumination CIE Publication Date2017-08-01 Pages CountPages48

The CIE 225:2017 standard focuses on the importance of accurately measuring and controlling the thermal conditions of LEDs in order to obtain reliable and reproducible results. Specifically, the standard addresses the measurement methods and procedures for high-power LEDs under DC operation, with the aim of acquiring photometric, radiometric, and colorimetric quantities at a specified junction temperature.

The standard emphasizes that accurate measurement results for LEDs are strongly influenced by their thermal conditions, and thus, it is crucial to adequately set and control the junction temperature during optical measurements. By establishing standardized procedures, the CIE 225:2017 standard ensures that measurements of high-power LEDs are conducted consistently, with minimal uncertainties. Lastly, the publication is available in English, although it includes a brief summary in French and German to cater to a wider audience.

Details
DescriptorsPhotometry, Colorimetry, Spectrophotometry
ICS Codes31.080 - Semiconductor devices
Language(s)English
ISBN9783902842121
File Size1.3 MB
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