ECIA EIA 364-25-E-2017

EIA 364-25-E-2017 PDF Download

Standard EN Sample
EIA 364-25-E-2017 Sample

Probe Damage Test Procedure for Electrical Connectors

Also Known As: EIA 364-25

SKU177662843 Published by Electronic Components Industry Association ECIA Publication Date2017 Pages CountPages13

The EIA 364-25-E-2017 standard outlines the specific method to be followed for testing the durability of round socket contacts in electrical connectors. This test is designed to mimic the abuse these contacts may experience in real-world conditions when probes are inserted into the socket contacts. The objective of this test is to ensure that the performance characteristics of the socket contacts, such as engagement and separation forces, are not significantly affected by the probing.

The standard provides guidelines on how to perform the test, which includes probing the socket contacts while they are either installed in the connector (for non-removable contacts) or outside of the connector housing (for removable contacts). By subjecting the contacts to this probing test, the standard aims to verify that the contacts remain in good working condition and that their performance is not compromised. It is important to note that this standard specifically focuses on round socket contacts but may also be applicable to other types of contacts.

Details
Language(s)English
File Size337.9 KB
Purchase Right after completing the purchase process, you will immediately get a digital copy of this standard which is: Not Locked Printable Multi-User $ 17.50