Semiconductor Devices - Mechanical and Climatic Test Methods - Part 41: Standard Reliability Testing Methods of Non-Volatile Memory Devices
Also Known As:
The IEC 60749-41:2020 standard outlines the necessary procedures for conducting reliable endurance, retention, and cross-temperature tests on non-volatile memory devices. These tests are essential in determining the reliability and performance of these devices under various conditions.
The standard refers to qualification specifications provided in JESD47 or developed using knowledge-based methods such as JESD94. These specifications include cycle counts, durations, temperatures, and sample sizes necessary for conducting the endurance and retention tests.
By adhering to the guidelines outlined in this standard, manufacturers and testing laboratories can ensure that non-volatile memory devices meet the required reliability standards. These tests allow for accurate assessment of how these devices perform under different environmental conditions and during prolonged use.
| Edition | 1.0 |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
| Language(s) | English + French |
| File Size | 1.6 MB |
