IEEE 1620-2008 PDF Download

IEEE 1620-2008 is a standard that provides guidelines for the electrical characterization of organic transistors and materials, specifically in the context of printed and organic electronics. It focuses on addressing the challenges and potential sources of measurement error that arise from the unique nature of these electronic devices.

The standard highlights the importance of proper design-of-experiment in electrical characterization to ensure accurate and reliable results. It emphasizes that high-impedance electrical measurements, which are often required for printed and organic transistors, can be particularly susceptible to measurement errors.

In addition to identifying common sources of measurement error, the standard also offers recommended practices to mitigate and characterize the effects of measurement artifacts and other sources of error encountered during electrical characterization.