SAE AS 6171/4:2016 PDF Download

The SAE AS 6171/4:2016 standard focuses on the use of Delid/Decapsulation Physical Analysis test methods to detect Suspect/Counterfeit (SC) Electrical, Electronic, and Electromechanical (EEE) components or parts. This standard provides standardized inspection and test procedures, as well as minimum training and certification requirements for personnel involved in this analysis.

The purpose of this standard is to effectively remove the cover or encapsulation of a hermetically sealed package in order to examine the internal structure of the component or part. This analysis helps in determining if the part is a suspect counterfeit. The information obtained from this inspection and analysis can be used to prevent the inclusion of counterfeit parts in assemblies, identify defective parts, and determine the disposition of parts exhibiting anomalies.

It is important to note that this standard should not be confused with Destructive Physical Analysis as defined in MIL-STD-1580, which focuses on inspection and interpretation of quality issues. AS6171/4 enables access to materials, design, and layout information, allowing for observation of trends in design and material or process changes made by the device manufacturer.

If AS6171/4 is invoked in a contract, the base document, AS6171 General Requirements, must also be followed.